Reliability of MEMS - Testing of Materials and Devices (Hardcover)


This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. Divided into two major parts, following a general introductory chapter to reliability issues, the first part looks at the mechanical properties of the materials used in MEMS, explaining in detail the necessary measuring technologies -- nanoindenters, bulge methods, bending tests, tensile tests, and others. Part Two treats the actual devices, organized by important device categories such as pressure sensors, inertial sensors, RF MEMS, and optical MEMS.

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Product Description

This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. Divided into two major parts, following a general introductory chapter to reliability issues, the first part looks at the mechanical properties of the materials used in MEMS, explaining in detail the necessary measuring technologies -- nanoindenters, bulge methods, bending tests, tensile tests, and others. Part Two treats the actual devices, organized by important device categories such as pressure sensors, inertial sensors, RF MEMS, and optical MEMS.

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Product Details

General

Imprint

Wiley-VCH Verlag GmbH

Country of origin

Germany

Series

Advanced Micro and Nanosystems

Release date

December 2007

Availability

Supplier out of stock. If you add this item to your wish list we will let you know when it becomes available.

First published

February 2008

Editors

,

Series editors

, , ,

Dimensions

249 x 181 x 21mm (L x W x T)

Format

Hardcover

Pages

324

ISBN-13

978-3-527-31494-2

Barcode

9783527314942

Categories

LSN

3-527-31494-6



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