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Springer-Verlag New York
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Hierarchical Modeling for VLSI Circuit Testing (Hardcover, 1990 ed.)
Debashis Bhattacharya
,
John P. Hayes
R
3,107
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Hierarchical Modeling for VLSI Circuit Testing (Paperback, Softcover reprint of the original 1st ed. 1990)
Debashis Bhattacharya
,
John P. Hayes
R
2,967
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Ships in 10 - 15 working days