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Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (Hardcover, 2010 ed.)
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
R
3,115
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Ships in 10 - 15 working days
Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (Paperback, 2010 ed.)
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
R
3,263
Add to Cart
Ships in 10 - 15 working days