A Designer's Guide to Built-In Self-Test (Hardcover, 2002 ed.)
Charles E. StroudA recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
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Product Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
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Product Details
General
Imprint | Springer-Verlag New York |
Country of origin | United States |
Series | Frontiers in Electronic Testing, 19 |
Release date | May 2002 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2002 |
Authors | Charles E. Stroud |
Dimensions | 235 x 155 x 20mm (L x W x T) |
Format | Hardcover |
Pages | 320 |
Edition | 2002 ed. |
ISBN-13 | 978-1-4020-7050-1 |
Barcode | 9781402070501 |
Categories | |
LSN | 1-4020-7050-0 |
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