Advances in Electronic Testing - Challenges and Methodologies (Hardcover, 1st ed. 2006. 2nd printing 2006)


This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.


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Product Description

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Series

Frontiers in Electronic Testing, 27

Release date

November 2006

Availability

Expected to ship within 10 - 15 working days

First published

2006

Editors

Dimensions

240 x 160 x 23mm (L x W x T)

Format

Hardcover

Pages

412

Edition

1st ed. 2006. 2nd printing 2006

ISBN-13

978-0-387-29408-7

Barcode

9780387294087

Categories

LSN

0-387-29408-2



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