This special volume of "Advances in Imaging and Electron Physics "details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
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This special volume of "Advances in Imaging and Electron Physics "details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
Imprint | Academic Press Inc |
Country of origin | United States |
Series | Advances in Imaging and Electron Physics |
Release date | September 2012 |
Availability | Expected to ship within 12 - 17 working days |
First published | August 2012 |
Volume editors | Jay Theodore Cremer Jr |
Dimensions | 229 x 152 x 30mm (L x W x T) |
Format | Hardcover |
Pages | 540 |
Edition | New |
ISBN-13 | 978-0-12-396969-9 |
Barcode | 9780123969699 |
Categories | |
LSN | 0-12-396969-7 |