This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques."
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This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques."
Imprint | Springer-Verlag New York |
Country of origin | United States |
Release date | April 2014 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2012 |
Authors | Marvin Onabajo, Jose Silva-Martinez |
Dimensions | 235 x 155 x 10mm (L x W x T) |
Format | Paperback |
Pages | 174 |
Edition | 2012 ed. |
ISBN-13 | 978-1-4899-9296-3 |
Barcode | 9781489992963 |
Categories | |
LSN | 1-4899-9296-0 |