Crucial Issues in Semiconductor Materials and Processing Technologies (Paperback, Softcover reprint of the original 1st ed. 1992)


Semiconductors lie at the heart of some of the most important industries and technologies of the twentieth century. The complexity of silicon integrated circuits is increasing considerably because of the continuous dimensional shrinkage to improve efficiency and functionality. This evolution in design rules poses real challenges for the materials scientists and processing engineers. Materials, defects and processing now have to be understood in their totality. World experts discuss, in this volume, the crucial issues facing lithography, ion implication and plasma processing, metallization and insulating layer quality, and crystal growth. Particular emphasis is placed upon silicon, but compound semiconductors and photonic materials are also highlighted. The fundamental concepts of phase stability, interfaces and defects play a key role in understanding these crucial issues. These concepts are reviewed in a crucial fashion.

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Product Description

Semiconductors lie at the heart of some of the most important industries and technologies of the twentieth century. The complexity of silicon integrated circuits is increasing considerably because of the continuous dimensional shrinkage to improve efficiency and functionality. This evolution in design rules poses real challenges for the materials scientists and processing engineers. Materials, defects and processing now have to be understood in their totality. World experts discuss, in this volume, the crucial issues facing lithography, ion implication and plasma processing, metallization and insulating layer quality, and crystal growth. Particular emphasis is placed upon silicon, but compound semiconductors and photonic materials are also highlighted. The fundamental concepts of phase stability, interfaces and defects play a key role in understanding these crucial issues. These concepts are reviewed in a crucial fashion.

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Product Details

General

Imprint

Springer

Country of origin

Netherlands

Series

NATO Science Series E:, 222

Release date

October 2012

Availability

Expected to ship within 10 - 15 working days

First published

1992

Editors

, , ,

Dimensions

240 x 160 x 29mm (L x W x T)

Format

Paperback

Pages

538

Edition

Softcover reprint of the original 1st ed. 1992

ISBN-13

978-9401052030

Barcode

9789401052030

Categories

LSN

9401052034



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