Electromagnetic Compatibility of Integrated Circuits - Techniques for low emission and susceptibility (Hardcover, 2006)


Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs.


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Product Description

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Release date

December 2005

Availability

Expected to ship within 10 - 15 working days

First published

2006

Editors

, ,

Dimensions

235 x 155 x 26mm (L x W x T)

Format

Hardcover

Pages

473

Edition

2006

ISBN-13

978-0-387-26600-8

Barcode

9780387266008

Categories

LSN

0-387-26600-3



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