Growth Curve Models and Statistical Diagnostics (Paperback, Softcover reprint of the original 1st ed. 2002)

,
Growth-curve models are generalized multivariate analysis-of-variance models. The basic idea of the models is to use different polynomials to fit different treatment groups involved in the longitudinal study. It is not uncommon, however, to find outliers and influential observations in growth data that heavily affect statistical inference in growth curve models. This book provides a comprehensive introduction to the theory of growth curve models with an emphasis on statistical diagnostics. A variety of issues on model fittings and model diagnostics are addressed, and many criteria for outlier detection and influential observation identification are created within likelihood and Bayesian frameworks. This book is intended for postgraduates and statisticians whose research involves longitudinal study, multivariate analysis and statistical diagnostics, and also for scientists who analyze longitudinal data and repeated measures. The authors provide theoretical details on the model fittings and also emphasize the application of growth curve models to practical data analysis, which are reflected in the analysis of practical examples given in each chapter. The book assumes a basic knowledge of matrix algebra and linear regression. Jian-Xin Pan is a lecturer in Medical Statistics of Keele University in the U.K. He has published more than twenty papers on growth curve models, statistical diagnostics and linear/non-linear mixed models. He has a long-standing research interest in longitudinal data analysis and repeated measures in medicine and agriculture. Kai-Tai Fang is a chair professor in Statistics of Hong Kong Baptist University and a fellow of the Institute of Mathematical Statistics. He has published several books with Springer-Verlag, Chapman & Hall, and Science Press and is an author or co-author of over one hundred papers. His research interest includes generalized multivariate analysis, elliptically contoured distributions and uniform design.

R3,040

Or split into 4x interest-free payments of 25% on orders over R50
Learn more

Discovery Miles30400
Mobicred@R285pm x 12* Mobicred Info
Free Delivery
Delivery AdviceShips in 10 - 15 working days



Product Description

Growth-curve models are generalized multivariate analysis-of-variance models. The basic idea of the models is to use different polynomials to fit different treatment groups involved in the longitudinal study. It is not uncommon, however, to find outliers and influential observations in growth data that heavily affect statistical inference in growth curve models. This book provides a comprehensive introduction to the theory of growth curve models with an emphasis on statistical diagnostics. A variety of issues on model fittings and model diagnostics are addressed, and many criteria for outlier detection and influential observation identification are created within likelihood and Bayesian frameworks. This book is intended for postgraduates and statisticians whose research involves longitudinal study, multivariate analysis and statistical diagnostics, and also for scientists who analyze longitudinal data and repeated measures. The authors provide theoretical details on the model fittings and also emphasize the application of growth curve models to practical data analysis, which are reflected in the analysis of practical examples given in each chapter. The book assumes a basic knowledge of matrix algebra and linear regression. Jian-Xin Pan is a lecturer in Medical Statistics of Keele University in the U.K. He has published more than twenty papers on growth curve models, statistical diagnostics and linear/non-linear mixed models. He has a long-standing research interest in longitudinal data analysis and repeated measures in medicine and agriculture. Kai-Tai Fang is a chair professor in Statistics of Hong Kong Baptist University and a fellow of the Institute of Mathematical Statistics. He has published several books with Springer-Verlag, Chapman & Hall, and Science Press and is an author or co-author of over one hundred papers. His research interest includes generalized multivariate analysis, elliptically contoured distributions and uniform design.

Customer Reviews

No reviews or ratings yet - be the first to create one!

Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Series

Springer Series in Statistics

Release date

October 2011

Availability

Expected to ship within 10 - 15 working days

First published

2002

Authors

,

Dimensions

235 x 155 x 21mm (L x W x T)

Format

Paperback

Pages

388

Edition

Softcover reprint of the original 1st ed. 2002

ISBN-13

978-1-4419-2864-1

Barcode

9781441928641

Categories

LSN

1-4419-2864-2



Trending On Loot