Biometrics is a rapidly evolving field with applications ranging from accessing one 's computer to gaining entry into a country. The deployment of large-scale biometric systems in both commercial and government applications has increased public awareness of this technology. Recent years have seen significant growth in biometric research resulting in the development of innovative sensors, new algorithms, enhanced test methodologies and novel applications. This book addresses this void by inviting some of the prominent researchers in Biometrics to contribute chapters describing the fundamentals as well as the latest innovations in their respective areas of expertise.
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Biometrics is a rapidly evolving field with applications ranging from accessing one 's computer to gaining entry into a country. The deployment of large-scale biometric systems in both commercial and government applications has increased public awareness of this technology. Recent years have seen significant growth in biometric research resulting in the development of innovative sensors, new algorithms, enhanced test methodologies and novel applications. This book addresses this void by inviting some of the prominent researchers in Biometrics to contribute chapters describing the fundamentals as well as the latest innovations in their respective areas of expertise.
Imprint | Springer-Verlag New York |
Country of origin | United States |
Release date | November 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2008 |
Editors | Anil K. Jain, Patrick Flynn, Arun A. Ross |
Dimensions | 235 x 155 x 32mm (L x W x T) |
Format | Paperback |
Pages | 556 |
Edition | Softcover reprint of hardcover 1st ed. 2008 |
ISBN-13 | 978-1-4419-4375-0 |
Barcode | 9781441943750 |
Categories | |
LSN | 1-4419-4375-7 |