Low-Power Variation-Tolerant Design in Nanometer Silicon (Hardcover, 2011 Ed.)


Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

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Product Description

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Release date

November 2010

Availability

Expected to ship within 12 - 17 working days

First published

2011

Editors

,

Dimensions

235 x 155 x 25mm (L x W x T)

Format

Hardcover

Pages

440

Edition

2011 Ed.

ISBN-13

978-1-4419-7417-4

Barcode

9781441974174

Categories

LSN

1-4419-7417-2



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