"Modeling Nanoscale Imaging in Electron Microscopy" presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Or split into 4x interest-free payments of 25% on orders over R50
Learn more
"Modeling Nanoscale Imaging in Electron Microscopy" presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Imprint | Springer-Verlag New York |
Country of origin | United States |
Series | Nanostructure Science and Technology |
Release date | April 2014 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2012 |
Editors | Thomas Vogt, Wolfgang Dahmen, Peter Binev |
Dimensions | 235 x 155 x 13mm (L x W x T) |
Format | Paperback |
Pages | 182 |
Edition | 2012 ed. |
ISBN-13 | 978-1-4899-9728-9 |
Barcode | 9781489997289 |
Categories | |
LSN | 1-4899-9728-8 |