Photo-induced Defects in Semiconductors (Hardcover)

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This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the properties of DX and EL2 centres in III-V compounds are presented. Additional crystalline materials are also dealt with, before a detailed description is given of the properties and kinetics of photo-induced defects in amorphous semiconductors. The book closes with an examination of the effects of photo-induced defects in a range of practical applications. Throughout, unifying concepts and models are stressed, and the book will be of great use to graduate students and researchers interested in the physics and materials science of semiconductors.

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Product Description

This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the properties of DX and EL2 centres in III-V compounds are presented. Additional crystalline materials are also dealt with, before a detailed description is given of the properties and kinetics of photo-induced defects in amorphous semiconductors. The book closes with an examination of the effects of photo-induced defects in a range of practical applications. Throughout, unifying concepts and models are stressed, and the book will be of great use to graduate students and researchers interested in the physics and materials science of semiconductors.

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Product Details

General

Imprint

Cambridge UniversityPress

Country of origin

United Kingdom

Series

Cambridge Studies in Semiconductor Physics and Microelectronic Engineering

Release date

1996

Availability

Expected to ship within 12 - 17 working days

First published

1996

Authors

,

Dimensions

229 x 152 x 17mm (L x W x T)

Format

Hardcover

Pages

230

ISBN-13

978-0-521-46196-2

Barcode

9780521461962

Categories

LSN

0-521-46196-0



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