Reliability of Nanoscale Circuits and Systems - Methodologies and Circuit Architectures (Hardcover, 2011 Ed.)

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This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

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Product Description

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Release date

October 2010

Availability

Expected to ship within 10 - 15 working days

First published

2011

Authors

, ,

Dimensions

235 x 155 x 18mm (L x W x T)

Format

Hardcover - Cloth over boards

Pages

195

Edition

2011 Ed.

ISBN-13

978-1-4419-6216-4

Barcode

9781441962164

Categories

LSN

1-4419-6216-6



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