This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Imprint | Springer-Verlag New York |
Country of origin | United States |
Release date | October 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2007 |
Editors | Weilie Zhou, Zhong Lin Wang |
Dimensions | 235 x 155 x 27mm (L x W x T) |
Format | Paperback |
Pages | 522 |
Edition | Softcover reprint of hardcover 1st ed. 2007 |
ISBN-13 | 978-1-4419-2209-0 |
Barcode | 9781441922090 |
Categories | |
LSN | 1-4419-2209-1 |