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Low Dielectric Constant Materials for IC Applications (Hardcover, 2003 ed.)
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4,617
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Electromigration in Metals - Fundamentals to Nano-Interconnects (Hardcover)
Paul S. Ho
,
Chao-Kun Hu
,
Martin Gall
,
Valeriy Sukharev
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2,285
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Materials Reliability in Microelectronics III: Volume 309 (Paperback)
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858
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Low Dielectric Constant Materials for IC Applications (Paperback, Softcover reprint of the original 1st ed. 2003)
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4,569
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Ships in 10 - 15 working days